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A Study of Delay Test for Sequential Circuit based on Boundary Scan Architecture
Lee Chang Hee, Kim Jeong Hwan, Yun Tae Jin, Nam In Gil, Ahn Gwang Seon The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 5, No. 3, pp. 862-872,
Mar.
1998
10.3745/KIPSTE.1998.5.3.862
10.3745/KIPSTE.1998.5.3.862
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Vol. 1, 2012
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Indexing
All publications of KTCCS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTCCS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
